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Scanning probe microscopes have a pattern that is closely sized to the finest cantilever tips challenging their resolution ability
Highly conductive Apex Sharp diamond probes
10nm Tip Radius
makes this product ideal for demanding specimen preparation in FESEM
StrataTek™ Double Folding Mesh Grids AFM/STM Pick-up Tool Scanning probe microscopes have aDESCRIPTION SIZE SPECIFICATIONS The StrataTek TEM grids for Transmission Electron Microscopy have a thickness of 25m and are manufactured using a micron precision etching process of thin foils. This method produces sturdy and rigid TEM grids. Both sides have the same surface characterization. StrataTek grids have a slightly higher density than grids made by electroplating. Corners where bars meet tend to be rounded. Available in coarser mesh sizes
