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SEM Magnification Standard and Stage Micrometer MRS-4 - Modification SPM Tools This includes thin film samples

SKU: 35728780358

4.3
USD341.18 USD389.18

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Ships within 48 hours · Estimated delivery Aug 15 - Aug 20

Description

This includes thin film samples of polycaprolactone (PCL

c) Polyethylene terephthalate (PET

- Topography imaging in PeakForce Tapping

Optional retainer & mounting available

SEM Magnification Standard and Stage Micrometer MRS-4 - Modification SPM Tools This includes thin film samplesDESCRIPTION Modify the MRS 4 to 3mm diameter x 0. 5mm thickness to fit into a TEM style holder. For use only in secondary or backscattered mode, not transmitted The 10x to 200,000x standard for Scanning Electron Microscopy with 1 2, 1, 2, 50 and 500m pitch patterns and X & Y Micro ruler Selected MRS 4 Patterns in Greater Detail Applications Electron microscopy SEM, in both SE and BSE mode, SEM FIB and TEM (with special version) Scanning Microscopies

Exchange/Return Notes
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